Investigation of interface trap charges and temperature variation in heterostacked-TFET
Sign Up to like & getrecommendations! Published in 2020 at "Indian Journal of Physics"
DOI: 10.1007/s12648-020-01834-z
Abstract: This paper analyzes the reliability issues of the Heterostacked-TFET (HS-TFET) in detail. The investigation of the device reliability is carried out by examining the effect of interface trap charges (ITCs) and the temperature affectability of… read more here.
Keywords: heterostacked tfet; variation; interface trap; trap ... See more keywords
Impact of Interface Trap Charges on the Electrical Characteristics of Back-Gated 2D Negative Capacitance (NC) FET
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Transactions on Nanotechnology"
DOI: 10.1109/tnano.2019.2950668
Abstract: In this letter, a fully analytical compact drain current model of back-gated two-dimensional (2D) negative capacitance (NC) FET including interface trap charges has been developed by solving Poisson's, drift-diffusion and 1-D Landau-Khalatnikov equations, and it… read more here.
Keywords: back gated; interface trap; interface; trap charges ... See more keywords