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Published in 2022 at "Advanced materials"
DOI: 10.1002/adma.202205381
Abstract: Novel memory devices are essential for developing low power, fast and accurate in-memory computing and neuromorphic engineering concepts that can compete with the conventional CMOS digital processors. 2D semiconductors provide a novel platform for advanced…
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Keywords:
mos2 channel;
neuromorphic engineering;
trap memory;
charge trap ... See more keywords
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Published in 2025 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2024.3505962
Abstract: Single-event effects (SEEs) induced by heavy ions were characterized on 32 distinct conductance states in 40-nm silicon-oxide–nitride-oxide–silicon (SONOS) charge-trap memory. These states were programmed onto three chips, each containing 256K SONOS memory devices in an…
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Keywords:
heavy ion;
memory;
charge trap;
trap memory ... See more keywords