Development of in-situ trap characterisation techniques for EMCCDs
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DOI: 10.1088/1748-0221/13/02/c02025
Abstract: The "trap pumping" technique has seen considerable use over recent years as a means to probe the intrinsic properties of silicon defects that can impact charge transfer performance within CCD-based technologies. While the theory behind… read more here.
Keywords: trap characterisation; trap pumping; pumping technique; situ trap ... See more keywords
Importance of charge capture in interphase regions during readout of charge-coupled devices
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Astronomical Telescopes, Instruments, and Systems"
DOI: 10.1117/1.jatis.4.1.018005
Abstract: Abstract. The current understanding of charge transfer dynamics in charge-coupled devices (CCDs) is that charge is moved so quickly from one phase to the next in a clocking sequence and with a density so low… read more here.
Keywords: coupled devices; trap pumping; charge coupled; charge ... See more keywords