Coeffect of trapping behaviors on the performance of GaN-based devices *
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DOI: 10.1088/1674-4926/39/9/094007
Abstract: Trap-induced current collapse has become one of the critical issues hindering the improvement of GaN-based microwave power devices. It is difficult to study the behavior of each trapping effect separately with the experimental measurement. Transient… read more here.
Keywords: current collapse; trapping behaviors; behaviors performance; gan based ... See more keywords