Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects
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DOI: 10.1109/ted.2019.2944193
Abstract: In this article, an analytical predictive model of interface charge traps in symmetric, long-channel double-gate, junctionless transistors (JLTs) is proposed based on a charge-based model. Interface charge traps arising from exposure to chemicals, high-energy ionizing… read more here.
Keywords: traps junctionless; charge traps; interface charge; charge ... See more keywords