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Published in 2021 at "Solar Energy Materials and Solar Cells"
DOI: 10.1016/j.solmat.2021.111341
Abstract: Abstract Recently, it has been shown that the investigation of minority carrier traps (traps) is a useful method to study defects in silicon wafers. In this paper, we report the presence of traps in p-type…
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Keywords:
traps type;
carrier traps;
investigation minority;
laser annealing ... See more keywords