Articles with "trench interface" as a keyword



Capacitive Deep Trench Interface Characterizations and Dark Current Modeling for Photogate Pixels

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Published in 2025 at "IEEE Transactions on Electron Devices"

DOI: 10.1109/ted.2024.3501255

Abstract: In a CMOS image sensor, the total dark current (DC) is the sum of several contributions that are difficult to discriminate, even if activation energies are extracted. For example, when considering the interface generation, there… read more here.

Keywords: trench interface; capacitive deep; dark current; deep trench ... See more keywords