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Published in 2020 at "Optics express"
DOI: 10.1364/oe.394939
Abstract: Through-focus scanning optical microscopy (TSOM) is a model-based optical metrology method that involves the scanning of a target through the focus of an optical microscope. Unlike a conventional optical microscope that directly extracts the diffraction-limited…
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Keywords:
focus scanning;
tsom;
motion free;
free tsom ... See more keywords