TSV-Defect Modeling, Detection and Diagnosis Based on 3-D Full Wave Simulation and Parametric Measurement
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DOI: 10.1109/access.2018.2879640
Abstract: In this paper, we present a TSV low-bandwidth equivalent lumped circuit model of common TSV defects as analyzed using a high-frequency structure simulator 3-D full wave simulation. By using the proposed model, the physical parameters… read more here.
Keywords: diagnosis; full wave; wave simulation; tsv defect ... See more keywords