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Published in 2017 at "Journal of Nuclear Materials"
DOI: 10.1016/j.jnucmat.2016.12.009
Abstract: Abstract Tungsten sub-nitride thin films deposited on silicon samples by reactive magnetron sputtering were used as a model system to study the phase stability and microstructural evolution during thermal treatments. XRD, SEM&FIB, XPS, RBS and…
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Keywords:
tungsten sub;
nitride thin;
reactive magnetron;
film ... See more keywords