Twice-Modulated Light in Fourier Transform Infrared (FT-IR) Spectrometers from Reflective Samples: Avoiding Distorted Intensity Values
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DOI: 10.1177/00037028211066336
Abstract: We document an artifact associated with the back reflection from samples or sampling accessories in Fourier transform spectrometers. Samples oriented normal to the incoming modulated beam can reflect light back to the interferometer and this… read more here.
Keywords: transform infrared; modulated light; transform; fourier transform ... See more keywords