Synchrotron X-ray topographic image contrast variation of screw-type basal plane dislocations located at different depths below the crystal surface in 4H-SiC
Sign Up to like & getrecommendations! Published in 2021 at "Acta Materialia"
DOI: 10.1016/j.actamat.2021.116746
Abstract: Abstract The contrast features of synchrotron X-ray topographic images of screw-type basal plane dislocations (BPDs) in on-axis 4H-SiC wafers have been studied. Screw BPD images are categorized into two types: one exhibiting a white line… read more here.
Keywords: screw type; type basal; basal plane; ray topographic ... See more keywords
Structural and electronic properties of a -edge dislocations along ⟨1-100⟩ in GaN
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5034198
Abstract: Computational analysis via molecular dynamics and density functional theory simulations elucidated the structural and electronic properties of a-type basal edge dislocations lying in the ⟨1–100⟩ direction in wurtzite GaN. As a particular and predominant type… read more here.
Keywords: structural electronic; edge dislocations; core configurations; electronic properties ... See more keywords