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Published in 2024 at "IEEE Transactions on Power Electronics"
DOI: 10.1109/tpel.2024.3448201
Abstract: Uneven dynamic currents between paralleled silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (mosfets) can cause unbalanced switching losses, challenging the circuit reliability. Therefore, it is essential to quantitatively evaluate unbalanced dynamic currents during circuit design and…
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Keywords:
energy;
switching currents;
unbalanced switching;
model ... See more keywords