Understanding the Image Contrast of Material Boundaries in IR Nanoscopy Reaching 5 nm Spatial Resolution
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DOI: 10.1021/acsphotonics.8b00636
Abstract: Scattering-type scanning near-field optical microscopy (s-SNOM) allows for nanoscale-resolved Infrared (IR) and Terahertz (THz) imaging, and thus has manifold applications ranging from materials to biosciences. However, a quantitatively accurate understanding of image contrast formation at… read more here.
Keywords: understanding image; image; contrast; material boundaries ... See more keywords