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Published in 2017 at "Solid-state Electronics"
DOI: 10.1016/j.sse.2017.04.009
Abstract: Abstract The carrier microscopic transport process of uniaxial strained Si n-channel metal-oxide semiconductor field-effect transistor (NMOSFET) has been analyzed under γ-ray radiation. The variation of electrical characteristics of the uniaxial strained Si nanometer NMOSFET has…
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Keywords:
dose radiation;
effect;
uniaxial strained;
total dose ... See more keywords
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Published in 2023 at "Physica Scripta"
DOI: 10.1088/1402-4896/accfcc
Abstract: Stress/strain engineering techniques are employed to boost the performance of Gate-all-around (GAA) vertically stacked nanosheet field-effect transistors (NSFETs) for 7 nm technology nodes and beyond. In this work, we report on the 3D numerical simulation…
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Keywords:
stress;
stress strain;
strain;
strained sige ... See more keywords