Multiple Cell Upsets Inside Aircrafts. New Fault-Tolerant Architecture
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DOI: 10.1109/taes.2018.2852198
Abstract: Multiple cell upsets (MCU) is an issue that has to be dealt with when designing electronics for working in a radiated environment. Furthermore, the constant evolution of ICs integration density causes an increment in the… read more here.
Keywords: fault tolerant; upsets inside; architecture; cell upsets ... See more keywords