The use of anomalous x-ray diffraction as a tool for the analysis of compound semiconductors
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DOI: 10.1088/1361-6641/aa8708
Abstract: We provide a review about the current and previous use of anomalous diffraction of x-rays in the analysis of compound semiconductors. Among the large number of available techniques, those that have been used in successful… read more here.
Keywords: use anomalous; compound semiconductors; diffraction; compound ... See more keywords