Detection of Recycled ICs Using Backscattering Side-Channel Analysis
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DOI: 10.1109/tvlsi.2022.3190236
Abstract: This article proposes a new, nondestructive method for detecting recycled integrated circuits (ICs) using the backscattering side-channel analysis (BSCA). In particular, this article explains the impact that aging has on the backscattering side-channel signal and… read more here.
Keywords: backscattering side; channel analysis; detection; side channel ... See more keywords