Investigation of Optoelectronic Properties in Germanium Nanowire Integrated Silicon Substrate Using Kelvin Probe Force Microscopy
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Nanotechnology"
DOI: 10.1109/tnano.2020.3010691
Abstract: Catalyst free Germanium (Ge) nanowires (NW) and thin film (TF) have been synthesized by employing GLAD technique inside an electron-beam evaporator. X-ray diffraction patterns confirmed the successful growth of polycrystalline Ge-NW and Ge-TF. The FEG-SEM… read more here.
Keywords: microscopy; probe force; using kelvin; kelvin probe ... See more keywords