Approaches for Memristive Structures Using Scratching Probe Nanolithography: Towards Neuromorphic Applications
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DOI: 10.3390/nano13101583
Abstract: This paper proposes two different approaches to studying resistive switching of oxide thin films using scratching probe nanolithography of atomic force microscopy (AFM). These approaches allow us to assess the effects of memristor size and… read more here.
Keywords: probe nanolithography; using scratching; scratching probe; memristive structures ... See more keywords