Prediction of the ESD Failure Current Based on a New Method Using the Shot Noise Model
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DOI: 10.1109/ted.2023.3305352
Abstract: Prediction of electrostatic discharge (ESD) protection performance is critical for estimating reliability in the IC design. However, due to the large injection and deep hysteresis encountered in the snapback of ESD devices, the failure current… read more here.
Keywords: shot noise; failure current; using shot; method using ... See more keywords