Surface potential measurements of a polymer film following primary ion gun irradiation for ToF-SIMS analysis of insulator using a Kelvin probe and the observation of effects from the vacuum gauge
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DOI: 10.1016/j.apsusc.2020.146561
Abstract: Abstract When an insulator sample is analyzed via time-of-flight secondary ion mass spectrometry (ToF-SIMS), charges accumulate on the sample surface due to the primary ion beam. These local surface charges and surface potentials cause many… read more here.
Keywords: surface; ion; tof sims; surface potential ... See more keywords