Thermal vacuum testing of Timepix3 detector
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DOI: 10.1088/1748-0221/15/03/c03040
Abstract: The thermal dependence of semiconductor detectors is one of their critical properties. This paper presents the results of the Timepix3 detector thermal vacuum testing, with respect to the effects on its properties and sensitivity. The… read more here.
Keywords: vacuum testing; space; detector; thermal vacuum ... See more keywords