Extreme expected values and their applications in quantum metrology
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DOI: 10.1103/physreva.105.023718
Abstract: Wangjun Lu, 2, ∗ Lei Shao, Xingyu Zhang, Zhucheng Zhang, Jie Chen, Hong Tao, and Xiaoguang Wang † Zhejiang Institute of Modern Physics, Department of Physics, Zhejiang University, Hangzhou 310027, China Department of Maths and… read more here.
Keywords: expected values; physics; applications quantum; metrology ... See more keywords