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Published in 2018 at "Microscopy Research and Technique"
DOI: 10.1002/jemt.23118
Abstract: A major challenge when performing scanning electron microscopy and X‐ray analysis on many ceramic materials is their electrical insulation properties, which leads to buildup of the surface charge and reduced contrast in the secondary electron…
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Keywords:
microscopy;
using duane;
yttrium aluminum;
ceramics using ... See more keywords