Millimeter-Wave Permittivity Variations of an HR Silicon Substrate from the Photoconductive Effect
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DOI: 10.3390/mi13101782
Abstract: The photoinduced microwave complex permittivity of a highly resistive single-crystal silicon wafer was extracted from a bistatic free-space characterization test bench operating in the 26.5–40 GHz frequency band under CW optical illumination at wavelengths of… read more here.
Keywords: variations silicon; permittivity variations; permittivity; millimeter wave ... See more keywords