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Published in 2017 at "Journal of Microelectromechanical Systems"
DOI: 10.1109/jmems.2016.2624423
Abstract: Through silicon vias (TSVs) are key enablers of 3-D integration technologies which, by vertically stacking and interconnecting multiple chips, achieve higher performances, lower power, and a smaller footprint. Copper is the most commonly used conductor…
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Keywords:
invar metal;
silicon vias;
high temperature;
vias invar ... See more keywords