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Published in 2018 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2018.2876506
Abstract: In the commonly used existing silicon-on-insulator microelectromechanical systems (MEMS) process, a silicon-oxide-silicon sandwich structure in the sensor device creates parasitic capacitance, which reduces the charge sensitivity. In this letter, for the first time, we demonstrate…
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Keywords:
glass;
silicon glass;
silicon;
tex math ... See more keywords