Investigation of Self-Heating Effect on the Void Embedded SOI MOSFETs
Sign Up to like & getrecommendations! Published in 2025 at "IEEE Journal of the Electron Devices Society"
DOI: 10.1109/jeds.2024.3495033
Abstract: Self-heating effect (SHE) in void embedded SOI (VESOI) MOSFET is analyzed using 3D finite-element method (FEM) to solve modified Fourier heat conduction equations. The induced void beneath the silicon channel results in a 42% increase… read more here.
Keywords: self heating; embedded soi; effect void; void embedded ... See more keywords
A Novel Approach to Integrating Thermal Performance and Total Ionizing Dose Hardening in Void-Embedded Silicon-on-Insulator MOSFET
Sign Up to like & getrecommendations! Published in 2025 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2024.3506504
Abstract: The excellent tolerance against total ionizing dose (TID) effect and high compatibility with conventional technology nodes has been demonstrated in our previous work with void-embedded-silicon-on-insulator (VESOI) device. However, the presence of embedded void structures within… read more here.
Keywords: void embedded; ionizing dose; embedded silicon; performance ... See more keywords