Sign Up to like & get
recommendations!
1
Published in 2020 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2020.3037539
Abstract: The transient overshoot behavior of bipolar devices is investigated by means of very fast transmission line pulses (VF-TLP). All devices under investigation, a forward biased diode, an open base transistor and a SCR comprise a…
read more here.
Keywords:
lowly doped;
bipolar devices;
overshoot;
voltages tlp ... See more keywords