Vulnerabilities and Reliability of ReRAM Based PUFs and Memory Logic
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DOI: 10.1109/tr.2019.2910793
Abstract: Resistive Random-Access Memory (ReRAM) devices have caught significant research attention as scalable nonvolatile memory technology for high-density data storage in 3-D crossbar architectures. ReRAM devices can switch with low programming voltages ( read more here.
Keywords: vulnerabilities reliability; memory; reram based; reram devices ... See more keywords