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Published in 2025 at "Nano letters"
DOI: 10.1021/acs.nanolett.5c03386
Abstract: In this study, using a set of scanning probe microscopy techniques, we investigate the electronic properties of the domain walls in the layered ferroelectric semiconductor of the transition metal oxide dihalide family, NbOI2. Although the…
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Keywords:
charged domain;
van der;
conducting domain;
walls van ... See more keywords