Use-wear and residue mapping on experimental chert tools. A multi-scalar approach combining digital 3D, optical, and scanning electron microscopy
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DOI: 10.1016/j.jasrep.2020.102236
Abstract: Abstract Optical (OM) and scanning electron microscopy (SEM) are among the most common techniques to characterize use-wear and residue patterns on stone tool surfaces. While the short depth of field of optical microscopes can be… read more here.
Keywords: wear residue; optical scanning; use wear; microscopy ... See more keywords