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Published in 2022 at "Materials"
DOI: 10.3390/ma15248858
Abstract: In this work, the sputtered deposited WOx/TaOx switching layer has been studied for resistive random-access memory (RRAM) devices. Gradual SET and RESET behaviors with reliable device-to-device variability were obtained with DC voltage sweep cycling without…
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Keywords:
wox taox;
forming free;
analog switching;
tunable analog ... See more keywords