Controlled wrinkling analysis of thin films on gradient substrates
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DOI: 10.1007/s10483-017-2199-9
Abstract: The paper investigates continuously changing wrinkle patterns of thin films bonded to a gradient substrate. Three types of gradient substrates including exponential, power-law, and symmetry models are considered. The Galerkin method is used to discretize… read more here.
Keywords: wrinkle patterns; thin films; gradient substrates; wrinkle stiffness ... See more keywords