An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam.
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DOI: 10.1016/j.ultramic.2019.04.005
Abstract: A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly… read more here.
Keywords: atom probe; xenon plasma; ion beam; ion ... See more keywords