Effect of argon sputtering on XPS depth-profiling results of Si/Nb/Si
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Electron Spectroscopy and Related Phenomena"
DOI: 10.1016/j.elspec.2017.09.009
Abstract: Ultrathin Si/Nb/Si trilayer is an excellent example of a system for which dimensionality effects, together with other factors like type of a substrate material and growth method, influence strongly its superconducting properties. This study offers… read more here.
Keywords: effect argon; depth; sputtering xps; depth profiling ... See more keywords
XPS Depth-Profiling Studies of Chlorophyll Binding to Poly(cysteine methacrylate) Scaffolds in Pigment–Polymer Antenna Complexes Using a Gas Cluster Ion Source
Sign Up to like & getrecommendations! Published in 2024 at "Langmuir"
DOI: 10.1021/acs.langmuir.4c01361
Abstract: X-ray photoelectron spectroscopy (XPS) depth-profiling with an argon gas cluster ion source (GCIS) was used to characterize the spatial distribution of chlorophyll a (Chl) within a poly(cysteine methacrylate) (PCysMA) brush grown by surface-initiated atom-transfer radical… read more here.
Keywords: xps depth; gas cluster; depth; chl ... See more keywords
XPS depth profiling of nano-layers by a novel trial-and-error evaluation procedure
Sign Up to like & getrecommendations! Published in 2024 at "Scientific Reports"
DOI: 10.1038/s41598-024-69495-0
Abstract: In spite of its superior chemical sensitivity, XPS depth profiling is rarely used because of the alteration introduced by the sputter removal process and the resulting inhomogeneous in-depth concentration distribution. Moreover, the application of XPS… read more here.
Keywords: xps depth; depth profiling; profiling nano; nano layers ... See more keywords