XPS investigation of monatomic and cluster argon ion sputtering of tantalum pentoxide
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.02.006
Abstract: In recent years, gas cluster ion beams (GCIB) have become the cutting edge of ion beam technology to sputter etch organic materials in surface analysis. However, little is currently known on the ability of argon… read more here.
Keywords: xps investigation; ar1000; ion; cluster ... See more keywords
XPS Investigation of the Source of GPS Arc Contamination
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Transactions on Plasma Science"
DOI: 10.1109/tps.2019.2921937
Abstract: Global positioning system (GPS) satellites are strongly suspected to arc into the space environment. Arcing on spacecraft due to differential charging can be blamed for a host of operational anomalies resulting in the loss of… read more here.
Keywords: arc; gps satellites; contamination; xps investigation ... See more keywords