Evolution of the chemical composition of Sn thin films heated during x-ray photoelectron spectroscopy
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DOI: 10.1016/j.surfin.2019.100378
Abstract: Abstract High-vacuum XPS have been used to analyse the surface modification of a 3 nm-thick Sn thin film on Si (100) before and after annealing up to 450 °C. Increasing the XPS stage temperature led to a… read more here.
Keywords: xps stage; thin film; chemical composition; evolution chemical ... See more keywords