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Published in 2024 at "Surface and Interface Analysis"
DOI: 10.1002/sia.7281
Abstract: X‐ray photoelectron spectroscopy (XPS) is widely used to determine the composition of elements and oxygen‐containing functional groups. Accurate determination of core‐electron binding energies (CEBEs) is essential for identifying the types and contents of oxygen‐functional groups…
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Keywords:
oxygen containing;
coal;
xps study;
surface ... See more keywords
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Published in 2018 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.09.205
Abstract: Abstract XP Spectroscopy is used to compare the states of the supported platinum particles in the samples of the Pt/Sibunit catalyst and the Pt/HOPG model system after treating in NO 2 at room temperature and…
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Keywords:
model real;
study interaction;
interaction model;
comparative xps ... See more keywords
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Published in 2025 at "Scientific Reports"
DOI: 10.1038/s41598-025-08421-4
Abstract: CuO is a p-type semiconductor that can be found useful in various applications, sensing, photocatalysis or photovoltaics. Better material performance can be achieved by doping. In our study the doping was done using Cr ions…
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Keywords:
cuo;
thin films;
cuo thin;
xps study ... See more keywords
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Published in 2019 at "Semiconductor Science and Technology"
DOI: 10.1088/1361-6641/aaef9f
Abstract: The ZrO2/La2O3 bilayer structure has been formed on Si by using atomic layer deposition system. The ZrO2/La2O3 (ZLS) bilayer was swapped to La2O3/ZrO2 (LZS) on Si and the interface properties were investigated. The chemical compositions…
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Keywords:
thin films;
xps study;
la2o3 zro2;
atomic layer ... See more keywords
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Published in 2022 at "Materials"
DOI: 10.3390/ma15093117
Abstract: In this work, we studied the phases in a Mg-Ti-O system using a 1:1 formulation of MgO:TiO2, mixing synthetic brucite of Mexican origin with TiO2 microparticles of high purity, with a heat treatment at 1100…
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Keywords:
brucite titania;
calcining mixtures;
tio2;
study calcining ... See more keywords
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Published in 2022 at "Materials"
DOI: 10.3390/ma15124285
Abstract: This paper reports an XPS surface study of pure phase BiFeO3 thin film produced and later etched by pure argon ions. Analysis of high-resolution spectra from Fe 2p, Bi 4f and 5d, O 1s, and…
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Keywords:
study bifeo3;
bifeo3 surface;
argon etching;
xps study ... See more keywords