Combined In Situ XRD and Ex Situ TEM Studies of Thin Ba0.5Sr0.5TiO3 Films Grown by PLD on MgO
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DOI: 10.1002/crat.201900235
Abstract: Dielectric barium strontium titanate films were deposited on MgO (001) substrate by pulsed‐laser deposition (PLD) and monitored in situ by means of reflection high‐energy electron diffraction and time‐resolved X‐ray diffraction (TRXRD). TRXRD showed two growth… read more here.
Keywords: mgo; xrd situ; tem; diffraction ... See more keywords