Determining the Free Carrier Density in CdxHg1–xTe Solid Solutions from Far-Infrared Reflection Spectra
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DOI: 10.1134/s1063782617130048
Abstract: A new contactless nondestructive technique for determining the free carrier density in single-crystal samples of CdxHg1–xTe solid solutions and multilayer epitaxial heterostructures based on them from farinfrared reflection spectra is proposed. The characteristic point and… read more here.
Keywords: xte solid; carrier density; cdxhg1 xte; density ... See more keywords