Diagnostic-driven yield engineering under atypical wafer foundry conditions
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DOI: 10.1016/j.microrel.2021.114076
Abstract: Abstract Typically, diagnostic-driven yield engineering consists of two sequential steps- data mining and failure analysis. Data mining seeks early feedback on suspected manufacturing process weakness while failure analysis reveals the physical defect to understand the… read more here.
Keywords: diagnostic driven; analysis; driven yield; yield ... See more keywords