Yield estimation in cotton using UAV-based multi-sensor imagery
Sign Up to like & getrecommendations! Published in 2020 at "Biosystems Engineering"
DOI: 10.1016/j.biosystemseng.2020.02.014
Abstract: Monitoring crop development and accurately estimating crop yield are important to improve field management and crop production. This study aimed to evaluate the performance of an unmanned aerial vehicle (UAV)-based remote sensing system in cotton… read more here.
Keywords: index; yield estimation; yield; uav based ... See more keywords
Maize yield estimation in West Africa from crop process-induced combinations of multi-domain remote sensing indices
Sign Up to like & getrecommendations! Published in 2019 at "European Journal of Agronomy"
DOI: 10.1016/j.eja.2019.04.007
Abstract: Abstract Remote sensing data, crop modelling, and statistical methods are combined in an original method to overcome current limitations of crop yield estimation. It is then tested for timely estimation of maize grain yields and… read more here.
Keywords: crop; remote sensing; yield; yield estimation ... See more keywords
Exploring the possibilities of remote yield estimation using crop water requirements for area yield index insurance in a data-scarce dryland
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Arid Environments"
DOI: 10.1016/j.jaridenv.2020.104261
Abstract: Abstract The need for accurate and meaningful agricultural data as the means of making vibrant policies and informed decisions, is an increasing concern for policymakers in developing countries such as Ethiopia, where such information is… read more here.
Keywords: yield estimation; crop water; yield; water requirements ... See more keywords
Wheat growth monitoring and yield estimation based on remote sensing data assimilation into the SAFY crop growth model.
Sign Up to like & getrecommendations! Published in 2022 at "Scientific reports"
DOI: 10.1038/s41598-022-09535-9
Abstract: Crop growth monitoring and yield estimate information can be obtained via appropriate metrics such as the leaf area index (LAI) and biomass. Such information is crucial for guiding agricultural production, ensuring food security, and maintaining… read more here.
Keywords: crop; yield estimation; crop growth; growth ... See more keywords
Synergy of optical and synthetic aperture radar data for early-stage crop yield estimation: a case study over a state of Germany
Sign Up to like & getrecommendations! Published in 2022 at "Geocarto International"
DOI: 10.1080/10106049.2022.2039306
Abstract: Abstract Traditional crop cutting experiment-based yield estimation method captures the regional yield variability but lacks field-level information. Satellite images hold enormous crop information at finer spatial resolution. Crop yield mapping with optical images is particularly… read more here.
Keywords: crop; crop yield; winter; yield ... See more keywords
Early Yield Estimation in Viticulture Based on Grapevine Inflorescence Detection and Counting in Videos
Sign Up to like & getrecommendations! Published in 2023 at "IEEE Access"
DOI: 10.1109/access.2023.3263238
Abstract: In viticulture, yield estimation is a key activity, which is important throughout the wine industry value chain. The earlier that an accurate yield estimation can be made the greater its value, increasing management options for… read more here.
Keywords: inflorescence; viticulture; yield; early yield ... See more keywords
Mating Sensitivity Analysis and Statistical Verification for Efficient Yield Estimation
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2018.2889764
Abstract: Parametric yield is a significant threat to the reliability of nanoscale analog and mixed-signal circuits. A critical yet challenging problem of yield estimation is to account for multiple circuit performance. In this paper, we propose… read more here.
Keywords: methodology; verification; yield; yield estimation ... See more keywords
Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2019.2940682
Abstract: Parametric yield estimation over multiple process corners plays an important role in robust circuit design. In this article, we propose a novel Bayesian inference method based on Bernoulli distribution (BI-BD) to efficiently estimate the multicorner… read more here.
Keywords: yield estimation; estimation multiple; bayesian inference; parametric yield ... See more keywords
Efficient Non-Monte-Carlo Yield Estimation
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3079105
Abstract: Parametric yield estimation is a critical component in the Integrated Circuit design flow. We propose an efficient non-Monte-Carlo yield estimation method. Key is the use of sensitivity information efficiently obtained with the nominal circuit response.… read more here.
Keywords: non monte; monte carlo; circuit; yield estimation ... See more keywords
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency
Sign Up to like & getrecommendations! Published in 2023 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2022.3193875
Abstract: With the ever-increasing transistor density and memory capability in integrated circuits, the high-sigma yield estimation has become a growing concern. This work presents an equiprobability-based local response surface (ELRS) method that can perform a high-sigma… read more here.
Keywords: method; yield estimation; sigma yield; high sigma ... See more keywords
Dynamic Write VMIN and Yield Estimation for Nanoscale SRAMs
Sign Up to like & getrecommendations! Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"
DOI: 10.1109/tcsi.2021.3110484
Abstract: The dynamic write-access operation in an SRAM has a long-tailed distribution that sets the threshold for write-access failures. The distribution takes a long time to evaluate since rare failure events lie in its long and… read more here.
Keywords: vmin yield; write access; yield estimation; write vmin ... See more keywords