Photochromic YOxHy Thin Films Examined by in situ Positron Annihilation Spectroscopy
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DOI: 10.12693/aphyspola.137.205
Abstract: Doppler broadening positron annihilation spectroscopy depth profiles were collected on photochromic YOxHy thin films. In situ UV illumination of photochromic semiconductor YOxHy films leads to an increase in S-parameter and a large reduction in W-parameter,… read more here.
Keywords: annihilation spectroscopy; yoxhy; positron annihilation; spectroscopy ... See more keywords