Stability of zinc nitride thin-film transistors under positive and negative bias stress
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DOI: 10.1016/j.sse.2020.107841
Abstract: Abstract In this work, the electrical stability of zinc nitride (Zn3N2) Thin-film Transistors (TFTs) under negative bias stress (NBS) and positive bias stress (PBS) is presented. The Zn3N2 TFTs were fabricated on plastic substrates. Spin-on… read more here.
Keywords: zinc nitride; thin film; bias stress; stress ... See more keywords