Low temperature ferromagnetic behavior and temperature dependent anomalous dielectric relaxation of Zn0.90Ni0.05Mn0.05O diluted magnetic semiconductor
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DOI: 10.1007/s10854-018-8831-8
Abstract: We report structural, magnetic and temperature dependent dielectric properties of diluted magnetic semiconductor Zn0.90Ni0.05Mn0.05O prepared by solid state reaction technique. X-ray diffraction analysis revealed formation of single phase hexagonal wurtzite structure. Scanning electron microscopy and… read more here.
Keywords: temperature; microscopy; temperature dependent; zn0 90ni0 ... See more keywords