Aging Benefits in Nanometer CMOS Designs
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Circuits and Systems II: Express Briefs"
DOI: 10.1109/tcsii.2016.2561206
Abstract: In this brief, we show that bias temperature instability (BTI) aging of MOS transistors, together with its detrimental effect for circuit performance and lifetime, presents considerable benefits for static power consumption due to subthreshold leakage… read more here.
Keywords: power reduction; power; static power; bti aging ... See more keywords
Univariate Power Analysis Attacks Exploiting Static Dissipation of Nanometer CMOS VLSI Circuits for Cryptographic Applications
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Emerging Topics in Computing"
DOI: 10.1109/tetc.2016.2563322
Abstract: In this work we focus on Power Analysis Attacks (PAAs) which exploit the dependence of the static current of sub-50 nm CMOS integrated circuits on the internally processed data. Spice simulations of static power have been… read more here.
Keywords: power analysis; cmos; exploiting static; power ... See more keywords
Leveraging Unused Resources for Energy Optimization of FPGA Interconnect
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2017.2691409
Abstract: Conventional field-programmable gate arrays are typically overprovisioned with routing resources to ensure that they meet routeability targets, which results in increased routing static and dynamic power. In this paper, we leverage the excess routing conductors… read more here.
Keywords: routing conductors; energy; power; dynamic power ... See more keywords
Variable Body Biasing (VBB) based VLSI Design Approach to Reduce Static Power
Sign Up to like & getrecommendations! Published in 2017 at "International Journal of Electrical and Computer Engineering"
DOI: 10.11591/ijece.v7i6.pp3010-3019
Abstract: The static power consumption is an important parameter concern in IC design due to t for a higher integration numbers of transistor to achieve greater performance in a single chip. Leakage current is the main… read more here.
Keywords: variable body; power; static power; vbb technique ... See more keywords